Room A (Main Hall) |
Room B (201) |
Room C (202) |
Room D (203) |
Room E (204) |
||
13:00
|
Opening Ceremony |
|||||
13:2514:25 |
Keynote (Main Hall)Development of Autonomous Driving Technologies and its futureRyota Shirato, Nissan Motor Company |
|||||
14:2514:35 |
Break |
|||||
14:3515:35 |
Keynote (Main Hall)Hybrid Memory Cube: The New Standard for Memory PerformanceScott Graham, Micron Technology, Inc. |
|||||
15:3516:35 |
Keynote (Main Hall)Introducing the latest 3D printing technology and applicationsNave Rachman, Stratasys Asia Pacific & Japan |
|||||
16:3516:45 |
Break |
|||||
16:45
|
WA1:
Automotive WA1-1 Direct Impingement Cooling of LED by Piezo Fan Randeep Singh, Ahmad Jalilvand, Kazuhiko Goto, Koichi Mashiko, Yuji Saito, Masataka Mochizuki, Fujikura / Japan WA1-2 <Session Invited> A Novel Direct Water and Double-Sided Cooled Power Module for HEV/EV Inverter Takeshi Tokuyama1, Kinya Nakatsu1, Atsuo Nishihara1, Koji Sasaki1, Ryuichi Saito2, 1Hitachi, 2Hitachi Automotive Systems / Japan Cancelled Molding Technology for Highly Integrated Transmission Control Unit Tetsuto Yamagishi, Takumi Nomura, Kengo Oka, Kazuya Hirasawa, DENSO / Japan WA1-3 Lead-free Solders for Solar and Electric Vehicles - reflections on the bridgestone world wolar challenge 2013 in “Arrow1” Kazuhiro Nogita1,2, James Kennedy1,3, John Amsler1, Matthew Greaves1, Cameron Tuesley1, Takatoshi Nishimura4, 1TeamArrow Solar Car Team, 2The University of Queensland, 3Tritium Pty / Australia, 4Nihon Superior / Japan |
WB1:
Materials
and
Processes-1 WB1-1 Effect of Surface Damage on Strength of Silicon Wafer for Solar Cells Daisuke Echizenya1,2, Katsuhiko Sasaki2, 1Mitsubishi Electric, 2Hokkaido University / Japan WB1-2 <Session Invited> Eco-Fabrication of Nano-metal Related Materials by Ultrasound Solid-liquid Reaction Yamato Hayashi, Tohoku University / Japan Cancelled Application of Pin-on-Elastic- Foundation Test to Evaluating Silicon Die Strength during Pick and-Place Process Ming-Yi Tsai1, P.S. Huang1, Jackson Chen2, 1Chang Gung University, 2ASE Group / Taiwan WB1-3 High Productivity Sputtering System for Seed Layer of Printed Circuit Board Tetsushi Fujinaga, ULVAC / Japan |
WC1: Advanced
Packaging-1 WC1-1 Newly Developed Ultra Thin Fan- Out Wafer Level Package for PoP Usage Haruo Shimamoto2, Kyoko Soga1, Katsuya Takemura1, Hideyoshi Yanagisawa1, Satoshi Asai1, Kazunori Kondo1, Michihiro Sugo1, Hideto Kato1, Yoshio Matsuda2, 1Shin-Etsu Chemical, 2Wave Technology / Japan WC1-2 Wafer Level Package by using Post Dicing Process Noriyuki Fujimori, Takatoshi Igarashi, Takahiro Shimohata, Takuro Suyama, Kazuhiro Yoshida, Yusuke Nakagawa, Tsutomu Nakamura, Olympus / Japan WC1-3 Process Integration for Backside Illuminated Image Sensor Stacked with Analog-to-Digital Conversion Chip H.H. Chang, C.H. Chien, Y.C. Lee, S.M. Lee, J.C. Wang, Y.W. Huang, C.J. Zhan, Z.C. Hsiao, P.J. Tzeng, C.H. Lee, T.S. Chen, C.T. Ko, W.C. Lo, M.J. Kao, ITRI / Taiwan |
WD1:
Substrates and Interposers |
WE1:
Thermal Management-1 |
|
|
Welcome Reception |
Room A (Main Hall) |
Room B (201) |
Room C (202) |
Room D (203) |
Room E (204) |
||
9:00
|
TA1: 3DIC
Packaging-1
TA1-1 A New Temporary Bonding Technology with Spin-on Glass and Hydrogenated Amorphous Si for 3D LSIs Hideto Hashiguchi, Takafumi Fukushima, Hisashi Kino, Kang-Wook Lee, Tetsu Tanaka, Mitsumasa Koyanagi, Tohoku University / Japan TA1-2 Effects of Ar Plasma and Ar Fast Atom Bombardment (FAB) Treatments on Cu/Polymer Hybrid Surface for Wafer Bonding Ran He, Tadatomo Suga, The University of Tokyo / Japan TA1-3 Process Integration of 3D Stacking for Backside Illuminated Image Sensor> Zhi-Cheng Hsiao, Cheng-Ta Ko, Hsiang-Hung Chang, Huan-Chun Fu, Chao-Kai Hsu, Shu-Man Li, Wen-Li Tsai, Wen-Wei Shen, Jen-Chun Wang, Yu-Min Lin, Wei-Chun Lo, ITRI / Taiwan TA1-4 Novel 3-Dimensional Package Structure with Micro-Pins and Electronic Components Nau Negishi, Mikio Nakamura, Takanori Sekido, Tsutomu Nakamura, Yu Kondo, Olympus / Japan |
TB1: Materials
and
Processes-2 TB1-1 Flip Chip Assembly with Wafer Level NCF Yuta Kobayashi, Toshihisa Nonaka, Toray Industries / Japan TB1-2 Novel Low Temperature Curable Photo-Sensitive Insulator Tomohiko Sakurai, Hikaru Mizuno, Kenji Okamoto, Katsumi Inomata, JSR / Japan TB1-3 Development of Fine Pitch Negative Tone Resist for Electro- Plating Hisanori Akimaru, Hidefumi Ishikawa, Hirokazu Sakakibara, Shingo Naruse, Kenji Okamoto, Katsumi Inomata, JSR / Japan TB1-4 Cancelled |
TC1: iNEMI TC1-1 <Session Invited> Develop Environmentally Sustainable Electronics Bill Bader, iNEMI / USA TC1-2 iNEMI Packaging Technology Roadmap Highlights Bill Bottoms1, Masahiro Tsuriya2, Chuck Richardson2, 1Third Millennium Test Solutions, 2iNEMI / USA TC1-3 High-voltage DC–DC Power Module Development Izuru Narita1, Rick Fishbune1, Randhir Malik1, David Mohr2, Harish Chandra3, Mark Schaffer4, Haley Fu4, 1IBM, 2Hewlett-Packard, 3Cisco Systems, 4iNEMI / USA TC1-4 Creep Corrosion Test in Flowers of Sulfur Chamber Haley Fu1, Prabjit Singh2, Jing Zhang2, 1iNEMI, 2IBM / USA |
TD1:
Printed
Electronics-1 TD1-1 <Session Invited> (50min.) Imperceptible Organic Electronic Systems for Bio-Medical Applications Tsuyoshi Sekitani, The University of Tokyo / Japan TD1-2 <Session Invited> Automated Manufacturing Line of All-Printed TFT Array Flexible Film Shinichi Nishi1,2, Toshihide Kamata1,3, 1JAPERA, 2Konica Minolta, 3AIST / Japan TD1-3 <Session Invited> Silver nanoInk Sintarable at Low Temperature -Conductive ink for printed electronics- Toshitsugu Terakawa, Hiroyoshi Koduma, Yuki Iguchi, Kazuki Okamoto, Daicel / Japan |
TE1:
Power Devices TE1-1 Thermoelectric Energy Harvesting Characteristics of Thin Film Devices Processed with Flip Chip Bonding Process Kwang-Jae Shin, Jae-Hwan Kim, Jung-Yeol Choi, Tae Sung Oh, Hongik University / Korea TE1-2 Risk of PV Fire Caused by Solder Bond Failure -Ag Dissolution into Solder in the Interconnection between Ag Electrode and Cu Ribbon- Uichi Itoh1, Manabu Yoshida1, Hideo Tokuhisa1, Kohichi Takeuchi2, Yasuyuki Takemura2, 1AIST, 2International Test & Engineering Services / Japan TE1-3 Comparative Analysis of the Process Window of Aluminum and Copper Wire Bonding for Power Electronics Applications Christopher Kaestle, Joerg Franke, Friedrich-Alexander-University of Erlangen-Nuremberg / Germany TE1-4 Direct Bonding of SiC by the Surface Activated Bonding Method Tadatomo Suga1, Fengwen Mu1, Masahisa Fujino1, Yoshikazu Takahashi2, Haruo Nakazawa2, Kennichi Iguchi2, 1The University of Tokyo, 2Fuji Electric / Japan |
|
10:40
|
Break |
|||||
10:50
|
Keynote (Main Hall)Implementation of High-Volume Genomic Analyses by Microfluidics/microchip Technologies:Towards Integrative Medical Sciences for Preventive Medicine Osamu Ohara, Kazusa DNA Research Institute; RIKEN Center for Integrative Medical Sciences |
|||||
11:50
|
Lunch |
|||||
12:50
|
TA2: Taiwan
Session TA2-1 <Session Invited> Advanced 3D Technology Update in Taiwan Shen-Li Fu, I-Shou University / Taiwan TA2-2 <Session Invited> (tentative) Heterogeous 3D Systems Integration CP Hung, ASE / Taiwan TA2-3 Electromigration and Thermomigration of Pb-free Microbumps in Three- Dimensional Integrated Circuits Packaging Fan-Yi Ouyang, Wei-Cheng Jhu, Hao Hsu, Tsung-Han Yang, National Tsing Hua University / Taiwan TA2-4 Characteristics of 600 V / 450 A IGBT Module Assembled by Ag Sintering Technology Jing-Yao Chang, Su-Yu Fun, Fang- Jun Leu, Kuo-Shu Kao, Chih-Ming Tzeng, Wei-Kuo Han, Chang Tao- Chih, ITRI / Taiwan |
TB2: Materials
and
Processes-3 TB2-1 Tin Pest in Lead-Free Solders? -Fundamental Studies on the Effect of Impurities on Phase Transformation Kinetics- Guang Zeng1, Stuart D. McDonald1, Keith Sweatman2, Kazuhiro Nogita1, 1The University of Queensland / Australia, 2Nihon Superior / Japan TB2-2 Phase Transformations of Alloyed and Core-shell Metallic Nanoparticles for Interconnect Applications Jenn-Ming Song, National Chung Hsing University / Taiwan TB2-3 Effect of Isothermal aging on the Growth Behavior of Cu/Al Intermetallic Compounds Omid Mokhtari1, Min-Su Kim1, Hiroshi Nishikawa1, Fumiyoshi Kawashiro2, Satoshi Itou2, Takehiko Maeda2, Tetsuya Hirose2, Takaki Eto2, 1Osaka University, 2Renesas Electronics / Japan TB2-4 Effect of Nickel Addition on Intermetallic Compound Properties of Sn-Cu Solder Alloy A.M. Zetty Akhtar, K. Hardinna Wirda, I. Siti Rabiatull Aisha, I. Mahadzir, University Malaysia Pahang / Malaysia |
TC2:Advanced
Packaging-2 TC2-1 Processing and Characterization of Circuit Metallization on a Stretchable Polymer Substrate for Stretchable Electronic Packaging Jung-Yeol Choi,Dae-Woong Park, Woo-Joon Kim, Tae Sung Oh, Hongik University / Korea TC2-2 Flip Chip Process on a Stretchable Polymer Substrate for Stretchable Electronic Packaging Jung-Yeol Choi, Woo-Joon Kim, Dae-Woong Park, Tae Sung Oh, Hongik University / Korea TC2-3 Room Temperature Bonding Method for Polymer Films by Surface Activated Bonding Method using Al Intermediate Layer Takashi Matsumae, Masahisa Fujino, Tadatomo Suga, The University of Tokyo / Japan TC2-4 Cutting Thin Glass by a Fiber Picosecond IR Laser Hsiang-Chen Hsu1, Pei-Chieh Chin1, Shih-Jeh Wu1, Winphyr Lin2, 1I-Shou University, 2ENR Tech. / Taiwan |
TD2:
Printed Electronics-2 |
TE2:
Medical Devices |
|
14:30
|
Break / Poster Session |
|||||
15:00
|
TA3: Korea
Session TA3-1 Manufacture of Copper Substarte for LED Package and its Characteristics Byung-Wook Ahn, Don-Hyun Choi, Seung-Boo Jung, Sungkyunkwan University / Korea TA3-2 Optimization of Levelers Concentration to Minimize the Contamination in Copper Via Filling Ja-Kyung Koo1, Tai-Hong Yim2, Jae-Ho Lee1, 1Hongik University, 2KITECH / Korea TA3-3 Properties of Polymer Solar Cells with Au Nanoparticle Doped Hole Transport Layer Byung Min Park, Gi Peum Kim, Seung Ho Kim, Ho Jung Chang, Dankook University / Korea TA3-4 Measurement and Comparison with Simulation for the Warpage Characteristics of Package-on- Packages Processed with Thin Dies and Thin Substrates Dong-Hyun Park1, Dong-Myung Jung1, Jung-Yeol Choi1, L. Fabiano2, C. Moraes2, E. Rhod2, W. Hasenkamp2, Tae Sung Oh1, 1Hongik University / Korea, 2Unisinos University / Brazil |
TB3: Materials
and
Processes-4 TB3-1 New Interconnection Alloy Metal for High Bonding Strength -Nano Composite Particles synthesized by nanomized method- Shigenobu Sekine1, Ryuji Kimura1, Keiji Okada1, Hiroaki Shindo1, Tatsuya Ooi1,Uichi Itoh2, Manabu Yoshida2, Hideo Tokuhisa2 1Napra, 2AIST /Japan TB3-2 Constitutive behavior and Anand Model of Novel Lead- Free Solder Sn-Zn-Bi-In-P Jian-Chun Liu, Hong-Jiao Yu, Gong Zhang, Zheng-Hong Wang, Ju-Sheng Ma, Tsinghua University / China TB3-3 Effect of Gold and Copper on Microstructural Evolution and Mechanical Durability of SAC305 Solder Joints S. Mukherjee1, A. Dasgupta1, J. Silk2, L. L. Ong3, 1University of Maryland, 2Agilent / USA, 3Agilent / Malaysia TB3-4 Multilayered Sn/Ag3Sn Electroplating on Cu Alloys for High Reliable Electronic/Electric Materials Song-Zhu Kure-Chu, Tohru Ogasawara, Hitoshi Yashiro, Rongbin Ye, Takuya Hhosokai, Michimasa Uchidate, Eiichi Suzuki, Tomoyuki Naito, Iwate University / Japan |
TC3: Advanced
Packaging-3 TC3-1 A 1020-lead, 240 micron pitch, 14 x 14mm Package-on-Package (PoP) and Manufacturing Infrastructure Rajesh Katkar, Rey Co, Wael Zohni, Invensas / USA TC3-2 Reliability Characterization of 2.5D Multi-Chip Module on Board Under Drop Impact Tzu-Hsuan Cheng1, Hsien-Chie Cheng2, Wen-Hwa Chen1, Hsin-Yi Huang3 Tao-Chih Chang3, 1National Tsing Hua University, 2Feng Chia University , 3ITRI / Taiwan TC3-3 A Frequency Enhanced Single Package Multi-Die Memory System Using An In-Package Flyby Configuration Zhuowen Sun, Kevin Chen, Kyongmo Bang, Invensas / USA TC3-4 A Microfluidic Interposer Based on Three Dimensional Molded Substrate Technology T. Leneke, S. Majcherek, S. Hirsch, M.-P. Schmidt, B. Schmidt, Otto-von- Guericke-University / Germany |
TD3:
Printed Electronics-3 TD3-1 <Session Invited> Ag Nanowire Film Produced by Photonic Curing Hideki Ohata, Yasunao Miyamura, Eri Nakazawa, Hiroshi Uchida, Showa Denko / Japan TD3-2 <Session Invited> Study on an Interconnect Technology toward Flexible Printed Electronics Ryosuke Mitsui1, Seiya Takahashi1, Shin-ichiro Nakajima1, Ken-ichi Nomura2, Hirobumi Ushijima2, 1Japan Aviation Electronics Industry, 2AIST / Japan TD3-3 <Session Invited> Printed E-textiles as Human- Machine Interfaces for Biological Signal Monitoring Masahiro Inoue1, Yasunori Tada1, Yosuke Itabashi1, Kakeru Kaga1, Tomohiro Tokumaru2, 1Gunma University,2Biosginal / Japan TD3-4 Relationship Between Shrinkage and Conductivity Properties of Cured Isotropic Conductive Adhesives Shigeru Kohinata1, Yosihiko Shiraki1, Masahiro Inoue2, Keisuke Uenishi1, 1Osaka University, 2Gunma University / Japan |
TE3:
N-MEMS-1 |
|
16:40
|
Break |
|||||
16:50
|
TA4: 3DIC
Packaging-2 TA4-1 Thermal Stresses around Void in Through Silicon Via in 3D SiP Takahiro Kinoshita1, Tomoya Sugiura1, Takashi Kawakami1, Keiji Matsumoto2, Sayuri Kohara2, Yasumitsu Orii2, 1Toyama Prefectural University, 2IBM Japan / Japan TA4-2 Thermal Stresses of TSV and Si Chip in 3D SiP under Device Operation and Reflow Process Tomoya Sugiura1, Takahiro Kinoshita1, Takashi Kawakami1, Keiji Matsumoto2, Sayuri Kohara2, Yasumitsu Orii2, 1Toyama Prefectural University, 2IBM Japan / Japan TA4-3 Virtical and Horizontal Location Design of Program Voltage Generator for 3D-Integrated ReRAM/NAND Flash Hyhrid SSD Tomoya Ishii, Koh Johguchi, Ken Takeuchi, Chuo University / Japan TA4-4 Accurate Resistance Measuring Method for High Density Post- Bond TSVs in 3D-SIC with Electrical Probes Shuichi Kameyama1,2, Masayuki Baba1, Yoshinobu Higami2, Hiroshi Takahashi2, 1Fujitsu, 2Ehime University / Japan |
TB4: Materials
and
Processes-5 TB4-1 Evaluation of Embedded Capacitors with Graft-Modified BaTiO3/Epoxy as Dielectrics Maobai Lai, Shuhui Yu, Rong Sun, Chinese Academy of Sciences / China TB4-2 Effect of Chemical Factors on the Evolution of Electrical Conductivity during Curing In Ag- Loaded Conductive Adhesives Composed of an Epoxy-Based Binder -A New Understanding of Electrically Conductive Adhesives- Yoshiaki Sakaniwa, Yasunori Tada, Masahiro Inoue, Gunma University / Japan TB4-3 Ultrasonic Bonding Method for Thin Film Capacitor Module Atsunori Hattori, Hirotaka Hatano, Hirotaka Ogawa, NODA SCREEN / Japan (18:05)
|
TC4:
DMR-Electrical-1 TC4-1 A Built-in Supply Current Test Circuit for Pin Opens in Assembled PCBs Shoichi Umezu, Masaki Hashizume, Hiroyuki Yotsuyanagi, University of Tokushima / Japan TC4-2 Pin Open Detection of BGA IC by Supply Current Testing Akira Ono1, Hiroyuki Yotsuyanagi2, Masaki Hashizume2, 1Kagawa National College of Technology, 2University of Tokushima / Japan TC4-3 Electrical Test Method of Open Defects at Data Buses in 3D SRAM IC Yudai Shiraishi1, Masaki Hashizume1, Hiroyuki Yotsuyanagi1, Tada Tetsuo2, Shyue-Kung Lu3, 1 University of Tokushima, 2Tokushima Bunri University / Japan, 3National Taiwan University of Science and Technology / Taiwan TC4-4 Method for Back-Annotating Per-Transistor Power Values onto 3DIC Layouts to Enable Detailed Thermal Analysis Samson Melamed1, Fumito Imura1, Masahiro Aoyagi1, Hiroshi Nakagawa1, Katsuya Kikuchi1, Michiya Hagimoto2, Yukoh Matsumoto2, 1AIST, 2TOPS Systems / Japan |
TD4: Printed
Electronics-4 TD4-1 Inkjet Printed Wireless Biosensors on Stretchable Substrate Hannu Sillanpaa, Eerik Halonen, Toni Liimatta, Matti Mantysalo, Tampere University of Technology / Finland TD4-2 Multilayer Ceramic Coil for Wireless Power Transfer System by Photo Resist Film Process Minami Takato, Tatsuya Nishi, Masato Kaneko, Junichi Tanida, Syogo Tada, Ken Saito, Fumio Uchikoba, Nihon University / Japan (17:40)
|
TE4:
N-MEMS-2 |
Room A (Main Hall) |
Room B (201) |
Room C (202) |
Room D (203) |
Room E (204) |
||
9:00
|
FA1: Thermal
Management-2 FA1-1 <Session Invited> Thermal Management of Dense Electronic Packaging by Heat Pipe and Piezo Fan Based Cooling Solutions Randeep Singh, Fujikura / Japan FA1-2 Cooling Technology of On- Vehicle Inverters with Functional Nano-Porous Foam Layer -Enhancement of Wettability and boiling heat transfer toward inverter cooling- Kazuhisa Yuki1, Tessai Sugiura2, Koichi Suzuki1, 1Tokyo University of Science-Yamaguchi, 2Tohoku University / Japan FA1-3 Integrated Vapor Chamber Heat Spreader for High Power Processors Thanh-Long Phan, Yuji Saito, Masataka Mochizuki, Fujikura / Japan FA1-4 Effect of Thermal Properties of Interposer Material on Thermal Performance of 2.5D Package Takashi Hisada, Yasuharu Yamada, IBM Japan / Japan |
FB1:
DMR-Electrical-2 FB1-1 Locally Shielded Differential- Paired Lines with Bend Discontinuities for SI and EMI Performances Yoshiki Kayano1, Masashi Ohkoshi1, Takuya Watabe1, Hiroshi Inoue2, 1Akita University, 2The Open University of Japan / Japan FB1-2 Electrical Characteristics of Build-up Substrates Using New Via Structures Tomoyuki Akahoshi1, Daisuke Mizutani1, Motoaki Tani1, Kenichirou Abe2, Syunji Baba3, Masateru Koide3, 1Fujitsu Laboratories, 2Fujitsu Interconnect Technologies, 3Fujitsu Advanced Technologies / Japan FB1-3 A Multiband Antenna with Fan- Shaped Monopole and Folded Element of 800 MHz, 2.0 GHz and UWB for 4G Smartphones Yusuke Akiyama1, Fukuro Koshiji1,2, Kohji Koshiji2, 1Kokushikan University, 2Tokyo University of Science / Japan Cancelled Enhanced Passive Equalizer Using the Open Stub Compensation Technique Sheng-Hua Huang1, Chih-Wen Kuo1, Chen-Chao Wang2, Toshihide Kitazawa3, 1National Sun Yat- Sen University, 2ASE / Taiwan, 3Ritsumeikan University / Japan |
FC1: Advanced
Packaging-4 FC1-1 Characterization of Micro Bump Formed by Injection Molded Solder (IMS) Technology Toyohiro Aoki, Kazushige Toriyama, Hiroyuki Mori, Yasumitsu Orii, IBM Japan / Japan FC1-2 Packaging of High-Temperature Planar Power Modules Interconnected by Low- temperature Sintering of Nanosilver Paste David W. Berry1, L. Jiang1, Yunhui Mei2, Shufang Luo3, Khai D. Ngo1, Guo-Quan Lu1,2, 1Virginia Tech / USA, 2Tianjin University / China, 3NBE Technologies / USA FC1-3 High-Speed Gold Laser-Plating on Nickel-Plated Copper Leadframe toward Flip-Chip Packaging Takahisa Sagawa1, Mamoru Mita2, Kazuhiko Yamasaki1, Katsuhiro Maekawa1,2, 1Ibaraki University, 2M&M Research Laboratory / Japan FC1-4 Package on Package DDR Power Integrity Design Heng Chuan Shu, Li Chuang Quek, Intel Microelectronics (M) / Malaysia |
FD1:
Interconnection-1 FD1-1 Fine-pitch Solder Joining for High Density Interconnection Kuniaki Sueoka, Sayuri Kohara, Akihiro Horibe, Fumiaki Yamada, Hiroyuki Mori, Yasumitsu Orii, IBM Research-Tokyo / Japan FD1-2 Fine-Pitch Hybrid Bonding with Cu/Sn Microbumps and Adhesive for High Density 3D Integration Masaki Ohyama1, Jun Mizuno1, Shuichi Shoji1, Masatsugu Nimura1,2, Toshihisa Nonaka3, Yoichi Shinba3, Akitsu Shigetou4, 1Waseda University, 2Toray Engineering, 3Toray Industries, 4NIMS / Japan FD1-3 The Fine Pitch Cu-pillar Bump Interconnect Technology Utilizing NCP Resin, Achieving the High Quality and Reliability Yoshikazu Shimote, Toshihiro Iwasaki, Masaki Watanabe, Shinji Baba, Michitaka Kimura, Renesas Electronics / Japan FD1-4 Effects of Bump Height and UBM Structure on The Reliability Performance of 60μm-Pitch Solder Micro Bump Interconnections Yu-Wei Huang1, Chau-Jie Zhan1, Lin Yu-Min1, Jing-Ye Juang1, Shin-Yi Huang1 Su-Mei Chen1, Chia-Wen Fan1, Ren-Shin Cheng1, Shu-Han Chao2, C. K. Lin2, Jie-An Lin2, Chih Chen2, 1ITRI, 2National Chiao Tung University / Taiwan |
FE1:
Optoelectronics-1 FE1-1 <Session Invited> Flip Chip LED Packaging Study & Technology Trend Tetsuya Onishi, Grand Joint Technology / Hong Kong FE1-2 Lens Forming by Stack Dispensing for LED Wafer Level Packaging Rong Zhang, Shi-Wei Ricky Lee, Jeffery Lo, HKUST / Hong Kong FE1-3 Dispensed Dome Lens Validation Through Optical Simulations for High Illuminance UV LED Module Cheng-Chun Liao, Hao-Xiang Lin, Chien-Lin Chang Chien, Chung-Min Chang, Chih-Peng Hsu, Advanced Optoelectronic Technology / Taiwan FE1-4 Effect of Die-attach Material on Thermal Performance of Chip-on- Board Packaging of 10W High Power LED Arrays Xin Li, Tianjin University / China |
|
10:40
|
Break |
|||||
10:50
|
Keynote (Main Hall)Gen-3 Embedded Cooling: Completing the Inward Migration of Thermal PackagingAvram Bar-Cohen, DARPA-MTO |
|||||
11:50
|
Lunch |
|||||
12:50
|
FA2:
More-than-Moore 2.0 - Is 2D really saturating? Will 3D really be coming?- FA2-1 <Session Invited> (50min.) Progress and Benchmarking of CMOS-Device Technologies Hitoshi Wakabayashi, Tokyo Institute of Technology / Japan FA2-2 <Session Invited> BEOL Device Technologies for Energy Efficient Computing Munehiro Tada, LEAP / Japan FA2-3 <Session Invited> TBD Koji Nii, Renesas Electronics / Japan FA2-4 <Session Invited> The New Cognitive Computing Era by 3D Integration Yasumitsu Orii, IBM Japan / Japan FA2-5 A Novel 3D IC Assembly Process for Ultra-Thin Chip Stacking Yu-Min Lin1, Chau-Jie Zhan1, Zhi-Cheng Hsiao1, Huan-Chun Fu1, Ren-Shin Cheng1, Yu-Wei Huang1, Shin-Yi Huang1, Su-Mei Chen1, Chia-Wen Fan1, Chun-Hsien Chien1, Cheng-Ta Ko1, Yu-Huan Guo2, Chang-Chun Lee2, Yoshihiro Tsutsumi3, Junsoo Woo3, Yoshikazu Suzuki3, Yusuke Sato3, Chien-Ting Liu3, Chih-Heng Chao3, 1ITRI, 2Chung Yuan Christian University / Taiwan, 3DISCO / Japan FA2-6 Cu-Cu Wafer Bonding: An Enabling Technology for Three- Dimensional Integration B. Rebhan1, T. Plach1, S. Tollabimazraehno2,3, V. Dragoi1, M. Kawano1, 1EV Group, 2Johannes Kepler University, 3Christian Doppler Laboratory for Microscopic and Spectroscopic Material Characterization / Aurtria FA2-7 High-performance Cooling System with Multi-channel Electro-osmotic Flow Pumps for High-power 3D-ICs H. Kudo1, T. Yonekawa1, S. Yoshimi1, Y. Oguri2, A. Tsukune3, Y. S. Kim3, H. Kitada3, K. Fjimoto1, I. Kinefuchi2, Y. Matsumoto2, T. Ohba3, 1Dai Nippon Printing, 2University of Tokyo, 3Tokyo Institute of Technology / Japan Panel Discussion (tentative) The panel will discuss new collaboration opportunities across the supply chain that may overcome possible economic constraints on the pace of device scaling. *This session will break for 30min. so that participants may join the Poster Session. |
FB2:
DMR-Mechanical FB2-1; Investigation of Solder Creep Behavior on Wafer Level CSP Under Thermal Cycling Loading Kai-Chiang Wu, Kuo-Ning Chiang, National Tsing Hua University / Taiwan FB2-2 Solder Crack Simulation using SPH Particle Method with Sub- Modeling Technique Chihiro J. Uchibori1, Seiki Sakuyma1, Yuzuru Sakai2, Thyon Su-I2, Takayuki Watanabe2, Nobuki Yamagata3, 1Fujitsu Laboratories, 2Yokohama National University, 3Advanced Creative Technology / Japan FB2-3 Stress Variation Analysis during Curing Process of Epoxy Underfill Hiroshi Yamaguchi, Toshiaki Enomoto, Toshiyuki Sato, Namics / Japan FB2-4 Reliability Improvements in Electronic Systems by Combining Condition Monitoring Approaches Kathleen Jerchel2, Michael Krueger1, Andreas Middendorf1, Nils F. Nissen2, Klaus-Dieter Lang1, 1Technische Universität Berlin, 2Fraunhofer IZM Berlin / Germany FB2-5 Fatigue Strength of Through Hole in Printed Circuit Board Shogo Iwade1, Takahiro Kinoshita1, Takashi Kawakami1, Hideki Mizushina2, Hiroshi Iinaga2, 1Toyama Prefectural University,2Oki Printed Circuits / Japan |
FC2: Thermal
Management-3 FC2-1 Development of 1kW DMFC System with Waste Heat Recovery for Improving Energy Efficiency Yuki Morimatsu, Zhen Guo, Masakazu Ohashi, Fujikura / Japan FC2-2 Calculation of Temperature Distribution of Power Si MOSFET with Electro-Thermal Analysis -The Effect of Boundary Condition- Risako Kibushi, Tomoyuki Hatakeyama, Shinji Nakagawa, Masaru Ishizuka, Toyama Prefectural University / Japan FC2-3 Molecular Modelling Approach to Screen Novel Thermal Management Materials Chatterjee Abhijit, Accelrys / Japan FC2-4 Thermal Management of Embedded Device Package Yukari Imaizumi, Toru Suda, Shigenori Sawachi, Akio Katsumata, Yoichi Hiruta, J-Devices / Japan FC2-5 Thermal Modeling of Electronic Components for Thermal Simulation of Electronic Equipment Katsuhiro Koizumi1, Tomoyuki Hatakeyama2, Takashi Fukue3, Masaru Ishizuka2, 1Cosel,2Toyama Prefectual University, 3Iwate University / Japan |
FD2:
Interconnection-2 |
FE2: Optoelectronics-2 |
|
14:55
|
Break / Poster Session |
|||||
15:25
|
FB3: Materials
and
Processes-6 FB3-1 Effect of Joining Conditions on the Joint Strength of Ag Nanoporous Bonding Min-Su Kim, Hiroshi Nishikawa, Osaka University / Japan FB3-2 Development of Low- Temperature Sintered Nano- Silver Pastes Using MO Technology and Resin Reinforcing Technology Noritsuka Mizumura, Koji Sasaki, Namics / Japan FB3-3 A Diffusion-Viscous Analysis of Pressure-Aided Drying of Nanosilver Bond-line for Low- Temperature Chip Joining Kewei Xiao1, Khai D.T.Ngo1, Guo-Quan Lu1,2, 1Virginia Tech / USA, 2Tianjin University / China FB3-4 Measurements of Electrical Resistance and Temperature Distribution During Current Assisted Sintering of Nanosilver Die-Attach Material Guo-Quan Lu1,2, Wanli Li1, Yunhui Mei1, Xin Li1, 1Tianjin University / China, 2Virginia Tech / USA FB3-5 Cancelled |
FC3:Thermal
Management-4 FC3-1 One-Dimensional Thermal Network Expression of Tablet Device with Slate Style Chassis Koji Nishi1, Tomoyuki Hatakeyama2, Shinji Nakagawa2, Masaru Ishizuka2, 1AMD Japan, 2Toyama Prefectural University / Japan FC3-2 Simulation Based Method to Eliminate the Effect of Electrical Transients from Thermal Transient Measurements Andras Vass-Varnai, Zoltan Sarkany, Attila Szel, Marta Rencz, Mentor Graphics / Hungary FC3-3 Thermal Transient Test based Thermal Structure Function Analysis of IGBT Package Yafei Luo1,3, Yasushi Kajita2, Tomoyuki Hatakeyama3, Shinji Nakagawa3, Masaru Ishizuka3, 1Mentor Graphics Japan, 2Nagoya Municipal Industrial Research Institute, 3Toyama Prefectural University / Japan (16:40)
|
FD3:
Interconnection-3 (17:05)
|
FE3:
Optoelectronics-3 |
P01 P02 P03 P04 P05 P06 P07 P08 P09 P10 P11 P12 P13 P14 P15 P16 P17 P18 P19 P20 P21 P22 P23 P24 P25 P26 P27 |
Analysis of Temperature
Distribution in Stacked IC with a Thermal
Simulation and a Specially Designed Test Structure Keita Yamada1, Toshihiro Matsuda1, Hideyuki Iwata1, Tomoyuki Hatakeyama1, Masaru Ishizuka1, Takashi Ohzone2, 1Toyama Prefectural University, 2Dawn Enterprise / Japan Efficient Delay-matching Bus Routing by using Multi-layers Yang Tian, Ran Zhang, Takahiro Watanabe, Waseda University / Japan Proposal of the application of the delamination test to semiconductor package design Ryuichi Kusama1, Qiang Yu2, Kyohei Yamashita2, Tomohiko Takeda2, 1DENSO, 2Yokohama National University / Japan Behavior Analysis Method for Product Design Support Eiji Morinaga, Hidefumi Wakamatsu, Eiji Arai, Hijiri Abiru, Osaka University / Japan Clarification of Transmission Mechanism in Human Body Communication between Head-Mounted Wearable Devices Dairoku Muramatsu, Yoshiaki Yokoyama, Ken Sasaki, The University of Tokyo / Japan Cancelled Takaaki Fujisawa1, Fukuro Koshiji1, Kohji Koshiji2, 1Kokushikan University, 2Tokyo University of Science / Japan Electromagnetic field analysis of Human Body Communication between Wearable and Stationary Devices including the Earth Ground Misaki Kurosu1, Fukuro Koshiji1, Kohji Koshiji2, 1Kokushikan University, 2Tokyo University of Science / Japan Cancelled Nanako Yuyama1, Fukuro Koshiji1, Kohji Koshiji2, 1Kokushikan University, 2Tokyo University of Science / Japan Hemocompatibility of DLC coating for blood analysis devices Keisuke Shiba1, Yasuharu Ohgoe, Kenji Hirakuri, Jun Mizuno, Shuichi Shoji, Kazuhide Ozeki, Keisuke Sato, Hukata Naoki, Ali Alanazi, 1Tokyo Denki University, 2Waseda University, 3Ibaraki University, 4International Center of Materials Nanoarchitectonics, 5King Saud University / Japan Effect of filler morphology on fatigue properties of stretchable wires printed with Ag pastes Yosuke Itabashi, Yasunori Tada, Masahiro Inoue, Gunma University / Japan Flexible and Capacitive Tactile Sensor Sheet Masanori Mizushima1, Shigeo Takagi1, Hiromichi Itano1, Tsutomu Obata2, Takashi Kasahara3, Shuich Shoji3, Jun Mizuno3, 1Oga, 2Toyama Industrial Technology Center, 3Waseda University / Japan Leadfree Solder joint non- uniformity study on SMT Anocha Sriyarunya, Jiraporn Tondtan, SPANSION(THAILAND) / Thailand Impact Properties of Sn-3Ag-0.5Cu Solder Ball Joint with Epoxy-Based Flux Akiyoshi Ishiyama1, Shohji Ikuo1, Ganbe Tatsuya2, Watanabe Hirohiko2, 1Gunma University, 2Fuji Electric / Japan Influence of intermetallic compounds on tensile strength of lead-free solder Masaya Iwasaki, Masashi Kurose, Akira Yamauchi, Gunma National College of Technology / Japan Increasing Bonding Strength of Chips and Substrates Assembly by Argon Plasma Cheng-Li Chuang1, Jong-Ning Aoh2, Bo-Zhi Yang2, 1Chung Shan Medical University, 2National Chung Cheng University / Taiwan Effect of Coupling Agent on Adhesion of Underfill Materials on Copper Hironao Mitsugi, Ikuo Shohji, Shinji Koyama, Shinya Kitagoh, Gunma University / Japan Effect of Fiber Direction and Temperature on Mechanical Properties of Short Fiber-Reinforced PPS Ryogo Takahashi1, Ikuo Shohji1, Yuki Seki2, Satoshi Maruyama2, 1Gunma University, 2Yamada Manufacturing / Japan Preparation of Aligned Conjugated Polymer Fibers By Electrospinning Hsiao-Chung Chu, Cho-Liang Chung, Yu-Hsuan Lin, Sheng-Li Fu, I-Shou University / Taiwan Morphology And Applications of TiO2 Electrospun Nanofiber Wei Chen, Cho-Liang Chung, Chih-Hao Hsu, Sheng-Li Fu, I-Shou University / Taiwan The study of optical variation for dispensing Lens type LED package Chien-Lin Chang Chien, Yu-Wei Tsai, Ya-Ting Wu, How-Wen Chen, Zheng-Hua Yang, Chung-Min Chang, Chih-Peng Hsu, Advanced Optoelectronic Technology / Taiwan Thermal Effect on the Radiation Flux of UV COB LED Package Yu-Wei Tsai, Chien Lin Chang Chien, Cheng Chun Liao, Chung-Min Chang, Chih-Peng Hsu, Fuh-Shyang Juang, Advanced Optoelectronic Technology / Taiwan Robust lensed fibers having high focusing effects in resin bond Kazuo Shiraishi1, Masaru Horiuchi1, Hidehiko Yoda1, Chen S. Tsai2, 1Utsunomiya University / Japan, 2University of California / USA A spot-size converter with vertical down taper for the coupling between single-mode fiber and silicon-wire waveguide Kazuo Shiraishi1, Ryutaro Takasaki1, Hidehiko Yoda1, Hideya Oshikiri1, Chen S. Tsai2, 1Utsunomiya University / Japan, 2University of California / USA Cancelled Meng-Huan Lu1, Chen-Chao Wang2, Chih-Wen Kuo1, Toshihide Kitazawa3, 1National Sun Yat- Sen University, 2Advanced Semiconductor Engineering / Taiwan, 3Ritsumeikan University / Japan Study on Bent Type of UWB Antenna Built in Electronic Equipment Housing Daisuke Momose, Takahiko Yamamoto, Kouji Koshiji, Tokyo University of Science / Japan A Flexible Broadband Antenna with Fan-Shaped and Trapezoidal Elements formed on Printed Circuit Board for Ultra-Wideband Radio Kazuya Hiraguri1, Fukuro Koshiji1, Kohji Koshiji2, 1Kokushikan University, 2Tokyo University of Science / Japan Comparison of Wireless Power Transmission Characteristics Using Circular-Coil Array and Elliptical Coil as a Transmission Coil Kohei Horigome1, Fukuro Koshiji1, Kohji Koshiji2, 1Kokushikan University, 2Tokyo University of Science / Japan |